Reverse antenna effect due to process-induced quasi-breakdown of gate oxide

Jone F. Chen, Carol Gelatos, Philip Tobin, Rob Shimer, Chenming Hu

研究成果: Paper同行評審

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Reverse antenna effect due to process-induced quasi-breakdown of gate oxide」主題。共同形成了獨特的指紋。

Engineering & Materials Science