摘要
The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, V ac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with V ac is a necessary step to establish the veracity of PFM hysteresis measurements.
| 原文 | English |
|---|---|
| 文章編號 | 192902 |
| 期刊 | Applied Physics Letters |
| 卷 | 101 |
| 發行號 | 19 |
| DOIs | |
| 出版狀態 | Published - 2012 11月 5 |
All Science Journal Classification (ASJC) codes
- 物理與天文學(雜項)
指紋
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