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Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy

  • E. Strelcov
  • , Y. Kim
  • , J. C. Yang
  • , Y. H. Chu
  • , P. Yu
  • , X. Lu
  • , S. Jesse
  • , S. V. Kalinin

研究成果: Article同行評審

59   !!Link opens in a new tab 引文 斯高帕斯(Scopus)

摘要

The dependence of field-on and field-off hysteresis loop shape in Piezoresponse Force Microscopy (PFM) on driving voltage, V ac, is explored. A nontrivial dependence of hysteresis loop parameters on measurement conditions is observed. The strategies to distinguish between paraelectric and ferroelectric states with small coercive bias and separate reversible hysteretic and non-hysteretic behaviors are suggested. Generally, measurement of loop evolution with V ac is a necessary step to establish the veracity of PFM hysteresis measurements.

原文English
文章編號192902
期刊Applied Physics Letters
101
發行號19
DOIs
出版狀態Published - 2012 11月 5

All Science Journal Classification (ASJC) codes

  • 物理與天文學(雜項)

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