摘要
A scalable varactor model based on the equations in the BSIM3v3 model (Berkeley short-channel IGFET model) is presented to model the behaviour of a silicon-based metal-insulatorsemiconductor (MIS) varactor with different device geometries and bias conditions at different operation frequencies. The root mean square (RMS) errors of the s-parameters between the measured and simulated data are less than 3%. The scalable model provides satisfactory performance prediction for realising silicon radio frequency integrated circuits (RFICs).
原文 | English |
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頁(從 - 到) | 760-761 |
頁數 | 2 |
期刊 | Electronics Letters |
卷 | 37 |
發行號 | 12 |
DOIs | |
出版狀態 | Published - 2001 六月 7 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering