SCHOTTKY BARRIER CHARACTERIZATION OF EPITAXIAL CoSi//2 ON LT AN BR 111 RT AN BR Si.

Y. C. Kao, Y. Y. Wu, K. L. Wang

研究成果: Conference article同行評審

指紋

深入研究「SCHOTTKY BARRIER CHARACTERIZATION OF EPITAXIAL CoSi//2 ON LT AN BR 111 RT AN BR Si.」主題。共同形成了獨特的指紋。

Engineering & Materials Science