The authors propose an easy and cost-effective meth-od for improving the reliability of see-through tandem modules. By adding hardener to the conventional see-through tandem modules, it was found that we could enhance the 1000-h-damp-heat-test degradation ratio from 82.64% to 89.6%, a near 7% enhancement. It was also found that the efficiency degraded only by 6.0% for the see-through tandem modules with hardener, after six IEC cycles. The smaller degradation ratio indicates that the see-through tandem modules with hardener were more reliable, as compared with the non-see-through tandem modules.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering