Simulation study of beam temperature effects of carbon nanotubes field emission source

Yung-Chiang Lan, Yu Hsiang Hsu

研究成果: Conference contribution

原文English
主出版物標題IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium
頁面237-238
頁數2
DOIs
出版狀態Published - 2006
事件19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006 - Guilin, China
持續時間: 2006 七月 172006 七月 20

Other

Other19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006
國家China
城市Guilin
期間06-07-1706-07-20

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

引用此

Lan, Y-C., & Hsu, Y. H. (2006). Simulation study of beam temperature effects of carbon nanotubes field emission source. 於 IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium (頁 237-238). [4134548] https://doi.org/10.1109/IVNC.2006.335446