Single-compound complementary split-ring resonator for simultaneously measuring the permittivity and thickness of dual-layer dielectric materials

Chieh Sen Lee, Chin-Lung Yang

研究成果: Article同行評審

31 引文 斯高帕斯(Scopus)

摘要

This paper presents the design and analysis of a single-compound complementary split-ring resonator (SC-CSRR) that induces two resonance frequencies for simultaneously measuring the thickness and permittivity of dual-layer dielectric structures. Two resonance frequencies were generated using two distinct embedded resonator current lengths in a single complementary split-ring resonator. These two resonance frequency responses were combined to determine the thickness and permittivity of a dual-layer dielectric sample. Methods proposed in this paper were used to analyze the equivalent permittivity relationship, and thus, determine the thickness and permittivity of the material under test. The proposed simple low-cost SC-CSRR measurement method for assessing the permittivity of materials in a compact area was experimentally analyzed and verified in experiments. The experimental results indicated that the average thickness and permittivity measurement errors were 6.26% and 4.63%, respectively, for single-layer samples, and 5.26% and 6.48%, respectively, for dual-layer samples.

原文English
文章編號7089316
頁(從 - 到)2010-2023
頁數14
期刊IEEE Transactions on Microwave Theory and Techniques
63
發行號6
DOIs
出版狀態Published - 2015 六月 1

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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