Single compound complementary split-ring resonator for simultaneously measuring permittivity and thickness

Chieh Sen Lee, Chin Lung Yang

研究成果: Conference contribution

7 引文 斯高帕斯(Scopus)

摘要

This paper presents a single compound complementary split-ring (SC-CSRR) to induce dual resonance frequencies for simultaneously measuring the permittivity and thickness of a material. The dual resonance frequencies, fL and fH, are generated using two distinct resonator current lengths in a single CSRR. By using the proposed methods, the ratio of dual resonance frequency relationship can be used to determine the thickness of the material under test (MUT); the permittivity is linearly related to the resonance frequency. A simple and low-cost SC-CSRR measurement method for assessing the permittivity of materials in a compact area was numerically analyzed and experimentally verified. Testing yielded average measurement errors of 6.26% and 4.63% for the thickness and permittivity, respectively.

原文English
主出版物標題2014 IEEE MTT-S International Microwave Symposium, IMS 2014
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(列印)9781479938698
DOIs
出版狀態Published - 2014 一月 1
事件2014 IEEE MTT-S International Microwave Symposium, IMS 2014 - Tampa, FL, United States
持續時間: 2014 六月 12014 六月 6

出版系列

名字IEEE MTT-S International Microwave Symposium Digest
ISSN(列印)0149-645X

Other

Other2014 IEEE MTT-S International Microwave Symposium, IMS 2014
國家United States
城市Tampa, FL
期間14-06-0114-06-06

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Lee, C. S., & Yang, C. L. (2014). Single compound complementary split-ring resonator for simultaneously measuring permittivity and thickness. 於 2014 IEEE MTT-S International Microwave Symposium, IMS 2014 [6848413] (IEEE MTT-S International Microwave Symposium Digest). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSYM.2014.6848413