TY - JOUR
T1 - Single crystalline iron silicide and beta-iron disilicide nanowires formed through chemical vapor deposition
AU - Huang, Wei Jie
AU - Chen, Yu Yang
AU - Hsu, Hsiu Ming
AU - Lu, Kuo Chang
N1 - Funding Information:
Conflicts of Interest: The authors declare no conflict of interest. Funding: This research was funded by Ministry of Science and Technology of Taiwan, grant number MOST 105-2628-E-006-002-MY3.
Publisher Copyright:
© 2018 by the authors.
PY - 2018/11/27
Y1 - 2018/11/27
N2 - In this paper, we report the synthesis of iron silicide and β-iron disilicide nanowires with chemical vapor deposition; remarkably, the latter has drawn much attention but has seldom been achieved. We also propose the formation mechanisms for the two phases. To investigate the effects of the growth parameters on compositions and morphologies of the iron silicide nanowires, we changed and studied the reaction time, substrate temperature, position of samples, and pressure. The reaction concentration was found to be altered by all of the parameters; thus, we observed different nanowires in terms of morphologies and compositions with scanning electron microscopy. To confirm the growth direction and crystal structure of the nanowires, we conducted x-ray diffraction and high-resolution transmission electron microscopy studies. With the potential of being utilized as circuit elements in electronic devices for Schottky barriers, ohmic contacts, and interconnection among silicon-based transistors, the silicide work at nanoscale is beneficial for nanoelectronics. Understanding the effects of these growth parameters facilitates the control of nanowire growth with better quality.
AB - In this paper, we report the synthesis of iron silicide and β-iron disilicide nanowires with chemical vapor deposition; remarkably, the latter has drawn much attention but has seldom been achieved. We also propose the formation mechanisms for the two phases. To investigate the effects of the growth parameters on compositions and morphologies of the iron silicide nanowires, we changed and studied the reaction time, substrate temperature, position of samples, and pressure. The reaction concentration was found to be altered by all of the parameters; thus, we observed different nanowires in terms of morphologies and compositions with scanning electron microscopy. To confirm the growth direction and crystal structure of the nanowires, we conducted x-ray diffraction and high-resolution transmission electron microscopy studies. With the potential of being utilized as circuit elements in electronic devices for Schottky barriers, ohmic contacts, and interconnection among silicon-based transistors, the silicide work at nanoscale is beneficial for nanoelectronics. Understanding the effects of these growth parameters facilitates the control of nanowire growth with better quality.
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U2 - 10.3390/ma11122384
DO - 10.3390/ma11122384
M3 - Article
AN - SCOPUS:85057313351
SN - 1996-1944
VL - 11
JO - Materials
JF - Materials
IS - 12
M1 - 2384
ER -