Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi2Se3

V. V. Chistyakov; A. N. Domozhirova; J. C.A. Huang; V. V. Marchenkov

doi:10.3103/S1062873819070116

Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi₂Se₃

V. V. Chistyakov
, A. N. Domozhirova
, J. C.A. Huang
, V. V. Marchenkov

物理學系

研究成果: Article › 同行評審

3 引文斯高帕斯（Scopus）

摘要

Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi₂Se₃ 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi₂Se₃ films; i.e., there is a linear dependence of a film’s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.

原文	English
頁（從 - 到）	838-840
頁數	3
期刊	Bulletin of the Russian Academy of Sciences: Physics
卷	83
發行號	7
DOIs	https://doi.org/10.3103/S1062873819070116
出版狀態	Published - 2019 7月 1

All Science Journal Classification (ASJC) codes

一般物理與天文學

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10.3103/S1062873819070116

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abstract = "Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi2Se3 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi2Se3 films; i.e., there is a linear dependence of a film{\textquoteright}s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.",

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AU - Chistyakov, V. V.

AU - Domozhirova, A. N.

AU - Huang, J. C.A.

AU - Marchenkov, V. V.

PY - 2019/7/1

Y1 - 2019/7/1

N2 - Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi2Se3 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi2Se3 films; i.e., there is a linear dependence of a film’s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.

AB - Abstract: The electrical resistivity of thin films of topological insulator (TI) Bi2Se3 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi2Se3 films; i.e., there is a linear dependence of a film’s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.

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JO - Bulletin of the Russian Academy of Sciences: Physics

JF - Bulletin of the Russian Academy of Sciences: Physics

IS - 7

ER -

Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi2Se3

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Size Effect in the Electrical Conductivity of Thin Films of Topological Insulator Bi₂Se₃