Soft X-ray emission and high-resolution photoemission study of quasi-two-dimensional superconductor NaxHfNCl

T. Takeuchi, S. Tsuda, T. Yokoya, T. Tsukamoto, S. Shin, A. Hirai, S. Shamoto, T. Kajitani

研究成果: Conference article同行評審

4 引文 斯高帕斯(Scopus)

摘要

We have performed soft X-ray emission (SXE) and high-resolution photoemission (PE) spectroscopy to study the electronic structures of β-HfNCl and Na-intercalated HfNCl. Both the PE and SXE spectra of Na 0.37HfNCl show an additional structure within the band gap of β-HfNCl, without an apparent shift in the energy position of valence-band features. These results clearly reveal intercalant-induced changes in the electronic structure of the layered nitride chlorides. From these results, we propose non-rigid band like behavior for this system in contrast to generally expected rigid-band filling upon intercalation.

原文English
頁(從 - 到)127-129
頁數3
期刊Physica C: Superconductivity and its applications
392-396
發行號PART 1
DOIs
出版狀態Published - 2003 十月
事件Proceedings of the 15th International Symposium on Superconduc - Yokohama, Japan
持續時間: 2002 十一月 112002 十一月 13

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 凝聚態物理學
  • 能源工程與電力技術
  • 電氣與電子工程

指紋

深入研究「Soft X-ray emission and high-resolution photoemission study of quasi-two-dimensional superconductor Na<sub>x</sub>HfNCl」主題。共同形成了獨特的指紋。

引用此