Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits

Erik Jan Marinissen, Ferenc Fodor, Arnita Podpod, Michele Stucchi, Yu Rong Jian, Cheng Wen Wu

研究成果: Conference contribution

摘要

Multi-die stacked ICs are getting increasing traction in the market, fueled by innovations in wafer processing technologies (e.g., vertical inter-die and intra-die connections), stack assembly, and advanced packaging approaches (e.g., wafer-level packaging). Given the non-perfect nature of their manufacturing processes, these stacked ICs (SICs) need all to be individually tested for manufacturing defects in an effective, yet efficient manner. This paper discusses a handful of probing challenges specific to such SICs and their solutions: probing ultra-thin wafers on a flexible tape on extra-large tape frames, probing on large arrays of dense micro-bumps, analyzing probe-to-pad alignment (PTPA) accuracy contributions from probe station and probe card on the basis of probe mark images, and efficient auto-correction of individual misalignments of singulated dies or die stacks on tape. The paper concludes with a real-life case study, in which most of the discussed challenges and solutions are combined.

原文English
主出版物標題International Test Conference 2018, ITC 2018 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781538683828
DOIs
出版狀態Published - 2019 一月 23
事件49th IEEE International Test Conference, ITC 2018 - Phoenix, United States
持續時間: 2018 十月 292018 十一月 1

出版系列

名字Proceedings - International Test Conference
2018-October
ISSN(列印)1089-3539

Conference

Conference49th IEEE International Test Conference, ITC 2018
國家United States
城市Phoenix
期間18-10-2918-11-01

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

指紋 深入研究「Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits」主題。共同形成了獨特的指紋。

引用此