摘要
We have grown a high-quality single-phase M-plane GaN on β-LiGaO2 (100) by plasma-assisted molecular beam epitaxy. The Hooke’s law for M-plane GaN was derived by a stress tenor transformation. From the analysis of M-plane GaN microstructure, the lattice strain of M-plane GaN along the [112¯0] and [0001] directions have been estimated. Based on the Hooke’s law, we calculated the ratio of anisotropic stress which was consistent with the ratio of thermal expansion-mismatch between GaN and LiGaO2 (100). We demonstrated that the thermal expansion mismatch was the major factor to degrade the quality of M-plane GaN on β-LiGaO2 (100).
| 原文 | English |
|---|---|
| 文章編號 | 075116 |
| 期刊 | AIP Advances |
| 卷 | 8 |
| 發行號 | 7 |
| DOIs | |
| 出版狀態 | Published - 2018 7月 1 |
All Science Journal Classification (ASJC) codes
- 一般物理與天文學
指紋
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