Structural characterization of La2-xMxCuO4 (M = Sr,Ba) samples by synchrotron x-ray and neutron powder diffraction techniques

D. E. Cox, S. C. Moss, C. W. Chu

研究成果: Article同行評審

10 引文 斯高帕斯(Scopus)

摘要

High-resolution synchrotron x-ray powder diffraction studies on samples of La2-xMx Cu04 (M = Sr,Ba) prepared by standard ceramic techniques show that macroscopic compositional inhomogeneities may exist that are unlikely to be revealed by conventional x-ray diffraction methods. Rietveld refinement of neutron data collected at 200, 50, and 11 K from one such sample, nominally La1.8 Sr0.2 Cu04, gave satisfactory fits to a tetragonal structure of K2NiF4 type at all three temperatures. However, careful individual peak fits revealed that part of the sample transforms to orthorhombic between 200 and 50 K. It is suggested that this multiphase character has an important influence on the superconducting properties.

原文English
頁(從 - 到)1327-1335
頁數9
期刊Journal of Materials Research
3
發行號6
DOIs
出版狀態Published - 1988 12月

All Science Journal Classification (ASJC) codes

  • 材料科學(全部)
  • 凝聚態物理學
  • 材料力學
  • 機械工業

指紋

深入研究「Structural characterization of La2-xMxCuO4 (M = Sr,Ba) samples by synchrotron x-ray and neutron powder diffraction techniques」主題。共同形成了獨特的指紋。

引用此