Structural transition in epitaxial Co/Cr multilayers as studied by X-ray absorption spectroscopy

W. F. Pong, Y. C. Liou, K. H. Chang, M. H. Tsai, H. H. Hseih, Y. K. Chang, P. K. Tseng, J. F. Lee, Y. Liou, J. C.A. Huang

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5 引文 斯高帕斯(Scopus)

摘要

We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co (40Å)/Cr (tCr) (tCr = 2, 3, 5, 7, and 9Å) multilayers. The Cr K x-ray absorption near edge structure (XANES) spectra of Co/Cr multilayers indicate an abrupt transition of the Cr layer from a bcc structure to a hep structure when the thickness of the Cr layer is decreased down to ∼5Å or three atomic layers. The structural transition and bond-length distortion in Cr and Co layers observed in the extended x-ray absorption fine structure (EXAFS) measurements are consistent with the XANES results.

原文English
頁(從 - 到)746-748
頁數3
期刊Journal of Synchrotron Radiation
6
發行號3
DOIs
出版狀態Published - 1999 5月 1

All Science Journal Classification (ASJC) codes

  • 輻射
  • 核能與高能物理
  • 儀器

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