摘要
We have performed Cr and Co K-edge x-ray-absorption measurements to investigate the dependence of local electronic and atomic structures on the Cr-layer thickness in epitaxial Co (40Å)/Cr (tCr) (tCr = 2, 3, 5, 7, and 9Å) multilayers. The Cr K x-ray absorption near edge structure (XANES) spectra of Co/Cr multilayers indicate an abrupt transition of the Cr layer from a bcc structure to a hep structure when the thickness of the Cr layer is decreased down to ∼5Å or three atomic layers. The structural transition and bond-length distortion in Cr and Co layers observed in the extended x-ray absorption fine structure (EXAFS) measurements are consistent with the XANES results.
原文 | English |
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頁(從 - 到) | 746-748 |
頁數 | 3 |
期刊 | Journal of Synchrotron Radiation |
卷 | 6 |
發行號 | 3 |
DOIs | |
出版狀態 | Published - 1999 5月 1 |
All Science Journal Classification (ASJC) codes
- 輻射
- 核能與高能物理
- 儀器