摘要
The structural and optical properties of green-light-emitting diodes grown by metalorganic chemical vapor deposition technique, were studied using high-resolution transmission electron microscopy, double crystal high resolution x-ray diffraction and low temperature photoluminescence. To study the microstructure of the layers, the back surface of the samples was mechanically polished and then thinned by an Ar + ion milling. A He-Cd laser was used for excitation, and a GaAs based photodetector was used to record excited emission.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 401-403 |
| 頁數 | 3 |
| 期刊 | Applied Physics Letters |
| 卷 | 85 |
| 發行號 | 3 |
| DOIs | |
| 出版狀態 | Published - 2004 7月 19 |
All Science Journal Classification (ASJC) codes
- 物理與天文學(雜項)
指紋
深入研究「Studies of InGaN/GaN multiquantum-well green-light-emitting diodes grown by metalorganic chemical vapor deposition」主題。共同形成了獨特的指紋。引用此
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