### 摘要

We study particle levitation in a dielectrophoretic field-flow fraction (DEP-FFF) flow sorter by using theoretical and numerical methods. By balancing DEP forces with gravitational and buoyant forces, one can obtain the analytical solution for the particle levitation height. Numerical simulation is carried out and used to compare with the analytical prediction. One can find that there exists a maximum particle levitation height at a specific electrode width (d) for each applied voltage. The maximum levitation height happens at h_{p} /d=0.95. The particle behaviors can be discussed based on the ratio between levitation height (h_{p}) and the width of electrode (d). When levitation height is higher than h_{p} /d >0.6, simulation results show excellent agreement (less than 2% error) with the first-order approximated analytical solution. When levitation height is between 0.43<h_{p} /d<0.6, the results start to show the large discrepancies (more than 2% error) between simulation and the firstorder approximated analytical solution. A higher order theoretical solution has to be considered for this situation. When levitation height is h_{p} /d <0.43, particles will stick on the bottom wall. Approximate theoretical solution is no longer applicable.

原文 | English |
---|---|

文章編號 | 021106 |

期刊 | Journal of Micro/Nanolithography, MEMS, and MOEMS |

卷 | 8 |

發行號 | 2 |

DOIs | |

出版狀態 | Published - 2009 一月 1 |

### 指紋

### All Science Journal Classification (ASJC) codes

- Electrical and Electronic Engineering
- Mechanical Engineering
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Atomic and Molecular Physics, and Optics

### 引用此文

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**Studies of particle levitation in a dielectrophoretic field-flow fraction-based microsorter.** / Leu, Tzong-Shyng; Weng, Chih Yuan.

研究成果: Article

TY - JOUR

T1 - Studies of particle levitation in a dielectrophoretic field-flow fraction-based microsorter

AU - Leu, Tzong-Shyng

AU - Weng, Chih Yuan

PY - 2009/1/1

Y1 - 2009/1/1

N2 - We study particle levitation in a dielectrophoretic field-flow fraction (DEP-FFF) flow sorter by using theoretical and numerical methods. By balancing DEP forces with gravitational and buoyant forces, one can obtain the analytical solution for the particle levitation height. Numerical simulation is carried out and used to compare with the analytical prediction. One can find that there exists a maximum particle levitation height at a specific electrode width (d) for each applied voltage. The maximum levitation height happens at hp /d=0.95. The particle behaviors can be discussed based on the ratio between levitation height (hp) and the width of electrode (d). When levitation height is higher than hp /d >0.6, simulation results show excellent agreement (less than 2% error) with the first-order approximated analytical solution. When levitation height is between 0.43p /d<0.6, the results start to show the large discrepancies (more than 2% error) between simulation and the firstorder approximated analytical solution. A higher order theoretical solution has to be considered for this situation. When levitation height is hp /d <0.43, particles will stick on the bottom wall. Approximate theoretical solution is no longer applicable.

AB - We study particle levitation in a dielectrophoretic field-flow fraction (DEP-FFF) flow sorter by using theoretical and numerical methods. By balancing DEP forces with gravitational and buoyant forces, one can obtain the analytical solution for the particle levitation height. Numerical simulation is carried out and used to compare with the analytical prediction. One can find that there exists a maximum particle levitation height at a specific electrode width (d) for each applied voltage. The maximum levitation height happens at hp /d=0.95. The particle behaviors can be discussed based on the ratio between levitation height (hp) and the width of electrode (d). When levitation height is higher than hp /d >0.6, simulation results show excellent agreement (less than 2% error) with the first-order approximated analytical solution. When levitation height is between 0.43p /d<0.6, the results start to show the large discrepancies (more than 2% error) between simulation and the firstorder approximated analytical solution. A higher order theoretical solution has to be considered for this situation. When levitation height is hp /d <0.43, particles will stick on the bottom wall. Approximate theoretical solution is no longer applicable.

UR - http://www.scopus.com/inward/record.url?scp=80055026907&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80055026907&partnerID=8YFLogxK

U2 - 10.1117/1.3142967

DO - 10.1117/1.3142967

M3 - Article

AN - SCOPUS:80055026907

VL - 8

JO - Journal of Micro/ Nanolithography, MEMS, and MOEMS

JF - Journal of Micro/ Nanolithography, MEMS, and MOEMS

SN - 1932-5150

IS - 2

M1 - 021106

ER -