Study of nanoindentation using fem atomic model

Yeau-Ren Jeng, Chung Ming Tan

研究成果: Conference contribution

摘要

This paper adopts an atomic-scale model based on the nonlinear finite element formulation to analyze the stress and strain induced in a very thin film during the nanoindentation process. The deformation evolution during the nanoindentation process is evaluated using the quasi-static method, thereby greatly reducing the required computation time. The finite element simulation results indicate that the microscopic plastic deformation in the thin film is caused by instability of its crystalline structure, and that the magnitude of the nano-hardness varies with the maximum indentation depth and the geometry of the indenter.

原文English
主出版物標題Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004
頁面1607-1615
頁數9
版本PART B
出版狀態Published - 2004 十二月 1
事件2004 ASME/STLE International Joint Tribology Conference - Long Beach, CA, United States
持續時間: 2004 十月 242004 十月 27

出版系列

名字Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004
號碼PART B

Conference

Conference2004 ASME/STLE International Joint Tribology Conference
國家United States
城市Long Beach, CA
期間04-10-2404-10-27

指紋

Nanoindentation
Nanohardness
Thin films
Indentation
Plastic deformation
Crystalline materials
Geometry

All Science Journal Classification (ASJC) codes

  • Engineering(all)

引用此文

Jeng, Y-R., & Tan, C. M. (2004). Study of nanoindentation using fem atomic model. 於 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004 (PART B 編輯, 頁 1607-1615). (Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004; 編號 PART B).
Jeng, Yeau-Ren ; Tan, Chung Ming. / Study of nanoindentation using fem atomic model. Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004. PART B. 編輯 2004. 頁 1607-1615 (Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004; PART B).
@inproceedings{d11896368eb8407a9553513510e93d79,
title = "Study of nanoindentation using fem atomic model",
abstract = "This paper adopts an atomic-scale model based on the nonlinear finite element formulation to analyze the stress and strain induced in a very thin film during the nanoindentation process. The deformation evolution during the nanoindentation process is evaluated using the quasi-static method, thereby greatly reducing the required computation time. The finite element simulation results indicate that the microscopic plastic deformation in the thin film is caused by instability of its crystalline structure, and that the magnitude of the nano-hardness varies with the maximum indentation depth and the geometry of the indenter.",
author = "Yeau-Ren Jeng and Tan, {Chung Ming}",
year = "2004",
month = "12",
day = "1",
language = "English",
isbn = "0791841812",
series = "Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004",
number = "PART B",
pages = "1607--1615",
booktitle = "Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004",
edition = "PART B",

}

Jeng, Y-R & Tan, CM 2004, Study of nanoindentation using fem atomic model. 於 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004. PART B edn, Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004, 編號 PART B, 頁 1607-1615, 2004 ASME/STLE International Joint Tribology Conference, Long Beach, CA, United States, 04-10-24.

Study of nanoindentation using fem atomic model. / Jeng, Yeau-Ren; Tan, Chung Ming.

Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004. PART B. 編輯 2004. p. 1607-1615 (Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004; 編號 PART B).

研究成果: Conference contribution

TY - GEN

T1 - Study of nanoindentation using fem atomic model

AU - Jeng, Yeau-Ren

AU - Tan, Chung Ming

PY - 2004/12/1

Y1 - 2004/12/1

N2 - This paper adopts an atomic-scale model based on the nonlinear finite element formulation to analyze the stress and strain induced in a very thin film during the nanoindentation process. The deformation evolution during the nanoindentation process is evaluated using the quasi-static method, thereby greatly reducing the required computation time. The finite element simulation results indicate that the microscopic plastic deformation in the thin film is caused by instability of its crystalline structure, and that the magnitude of the nano-hardness varies with the maximum indentation depth and the geometry of the indenter.

AB - This paper adopts an atomic-scale model based on the nonlinear finite element formulation to analyze the stress and strain induced in a very thin film during the nanoindentation process. The deformation evolution during the nanoindentation process is evaluated using the quasi-static method, thereby greatly reducing the required computation time. The finite element simulation results indicate that the microscopic plastic deformation in the thin film is caused by instability of its crystalline structure, and that the magnitude of the nano-hardness varies with the maximum indentation depth and the geometry of the indenter.

UR - http://www.scopus.com/inward/record.url?scp=21244484690&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=21244484690&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:21244484690

SN - 0791841812

T3 - Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004

SP - 1607

EP - 1615

BT - Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004

ER -

Jeng Y-R, Tan CM. Study of nanoindentation using fem atomic model. 於 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004. PART B 編輯 2004. p. 1607-1615. (Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004; PART B).