Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films

C. H. Lee, K. L. Yu, J. C.A. Huang, G. Felcher

研究成果: Conference article

2 引文 斯高帕斯(Scopus)

摘要

Polarized neutron and X-ray reflectivity methods have been used to study the permalloy epitaxial thin films on sapphire with Cr as a buffer layer. The reflectivity result indicates that the magnetic interface is smoother than the chemical interface. It is possible that the magnetic moment of the intrusive Ni or Fe atoms across the interface can be assimilated by the near-by Cr atoms or the other way around.

原文English
頁(從 - 到)1491-1494
頁數4
期刊Journal of Physics and Chemistry of Solids
60
發行號8
DOIs
出版狀態Published - 1999 一月 1
事件Proceedings of the 1998 7th ISSP International Symposium Frontiers in Neutron Scattering Research (ISSP7) - Tokyo, Jpn
持續時間: 1998 十一月 241998 十一月 27

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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