In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.
|頁（從 - 到）||85-88|
|期刊||Proceedings - IEEE International Symposium on Circuits and Systems|
|出版狀態||Published - 1994|
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials