Super fast and memory efficient diagnostic simulation algorithm for combinational circuits

Jer-Min Jou, Shung Chih Chen, Ren Der Chen

研究成果: Article同行評審

摘要

In this paper, we present an efficient diagnostic simulation method for combinational circuits. Two concepts are incorporated in this method. We adopt the critical line concept so that only stems, instead of all the faults, need to record the primary output responses and introduce the parallel simulation concept to propagate the effects of all the stems simultaneously. With these two approaches, our diagnostic simulator is efficient in speed and memory usage compared to an existed one.

原文English
頁(從 - 到)85-88
頁數4
期刊Proceedings - IEEE International Symposium on Circuits and Systems
1
出版狀態Published - 1994

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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