Surface Defect Inspection by a Fine-tuned YOLO Method for Wafer Fabrication

Han-Yu Lin, Jie-Yao Yang, Szu-Han Yu, Chih-Yin Liu, Tzuu-Hseng S. Li

研究成果: Conference contribution

原文English
主出版物標題2019 International Conference on Advanced Technology Innovation (ICATI 2019)
出版地Sapporo, Hokkaido, Japan
出版狀態Published - 2019 七月

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