Surface Defect Inspection by a Fine-tuned YOLO Method for Wafer Fabrication

Han-Yu Lin, Jie-Yao Yang, Szu-Han Yu, Chih-Yin Liu, Tzuu-Hseng S. Li

研究成果: Conference contribution

原文English
主出版物標題2019 International Conference on Advanced Technology Innovation (ICATI 2019)
出版地Sapporo, Hokkaido, Japan
出版狀態Published - 2019 七月

引用此

Lin, H-Y., Yang, J-Y., Yu, S-H., Liu, C-Y., & Li, T-H. S. (2019). Surface Defect Inspection by a Fine-tuned YOLO Method for Wafer Fabrication. 於 2019 International Conference on Advanced Technology Innovation (ICATI 2019)