Surface Defect Inspection by a Fine-tuned YOLO Method for Wafer Fabrication

研究成果: Conference contribution

原文	English
主出版物標題	2019 International Conference on Advanced Technology Innovation (ICATI 2019)
出版地	Sapporo, Hokkaido, Japan
出版狀態	Published - 2019 7月

引用此

@inproceedings{f88cc412859e4a56bf506d8cb6c23c73,

title = "Surface Defect Inspection by a Fine-tuned YOLO Method for Wafer Fabrication",

author = "Han-Yu Lin and Jie-Yao Yang and Szu-Han Yu and Chih-Yin Liu and Li, \{Tzuu-Hseng S.\}",

year = "2019",

month = jul,

language = "English",

booktitle = "2019 International Conference on Advanced Technology Innovation (ICATI 2019)",

}