摘要
The effect of surface roughness on magnetoresistance of permalloy ring structure is investigated. Microstructured permalloy rings with surface roughness varying from 4.2 to 21 nm were fabricated using electron beam lithography and a chemical etching process. It is found experimentally that the first and second nucleation fields decrease obviously with the surface roughness increasing, and the field range for the flux-closure state is not associated with surface roughness. The results indicate that surface roughness in permalloy ring structure is an important factor that influences the magnetic behaviors of the ring. This result can provide important information for future designs of ring-shaped magnetic devices.
原文 | English |
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文章編號 | 2273875 |
期刊 | IEEE Transactions on Magnetics |
卷 | 50 |
發行號 | 1 |
DOIs | |
出版狀態 | Published - 2014 1月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 電氣與電子工程