Temperature- and intensity-dependent photovoltaic measurements to identify dominant recombination pathways

Riley E. Brandt, Niall M. Mangan, Jian V. Li, Rachel C. Kurchin, Timothy Milakovich, Sergiu Levcenco, Eugene A. Fitzgerald, Thomas Unold, Tonio Buonassisi

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

In novel photovoltaic absorbers, it is often difficult to assess the root causes of low open-circuit voltages, which may be due to bulk recombination or sub-optimal contacts. In the present work, we discuss the role of temperature- and illumination-dependent device electrical measurements in quantifying and distinguishing these performance losses - in particular, for determining bounds on interface recombination velocities, band alignment, and minority carrier lifetime. We assess the accuracy of this approach by direct comparison to photoelectron spectroscopy. Then, we demonstrate how more computationally intensive model parameter fitting approaches can draw more insights from this broad measurement space. We apply this measurement and modeling approach to high-performance III-V and thin-film chalcogenide devices.

原文English
主出版物標題2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1997-2001
頁數5
ISBN(電子)9781509027248
DOIs
出版狀態Published - 2016 十一月 18
事件43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
持續時間: 2016 六月 52016 六月 10

出版系列

名字Conference Record of the IEEE Photovoltaic Specialists Conference
2016-November
ISSN(列印)0160-8371

Other

Other43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
國家/地區United States
城市Portland
期間16-06-0516-06-10

All Science Journal Classification (ASJC) codes

  • 控制與系統工程
  • 工業與製造工程
  • 電氣與電子工程

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