Temperature- and intensity-dependent photovoltaic measurements to identify dominant recombination pathways

Riley E. Brandt, Niall M. Mangan, Jian V. Li, Rachel C. Kurchin, Timothy Milakovich, Sergiu Levcenco, Eugene A. Fitzgerald, Thomas Unold, Tonio Buonassisi

研究成果: Conference contribution

摘要

In novel photovoltaic absorbers, it is often difficult to assess the root causes of low open-circuit voltages, which may be due to bulk recombination or sub-optimal contacts. In the present work, we discuss the role of temperature- and illumination-dependent device electrical measurements in quantifying and distinguishing these per form ance losses - in particular, for determining bounds on interface recombination velocities, band alignment, and minority carrier lifetime. We assess the accuracy of this approach by direct comparison to photoelectron spectroscopy. Then, we demonstrate how more computationally intensive model parameter fitting approaches can draw more insights from this broad measurement space. We apply this measurement and modeling approach to high- performance III-V and thin-film chalcogenide devices.

原文English
主出版物標題2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面893-895
頁數3
ISBN(電子)9781509056057
DOIs
出版狀態Published - 2017
事件44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
持續時間: 2017 六月 252017 六月 30

出版系列

名字2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
國家/地區United States
城市Washington
期間17-06-2517-06-30

All Science Journal Classification (ASJC) codes

  • 可再生能源、永續發展與環境
  • 電氣與電子工程
  • 電子、光磁材料

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