TY - GEN
T1 - Temperature-based phase change memory model for pulsing scheme assessment
AU - Liao, Yi Bo
AU - Lin, Jun Tin
AU - Chiang, Meng Hsueh
PY - 2008
Y1 - 2008
N2 - A physical yet analytical phase change memory (PCM) model simultaneously accounting for thermal and electrical conductivities is presented. Due to the physics based nature of the model, the essential temperature from heating and cooling of PCM during operation is instantaneously updated. More importantly, the model can be applied to non-conventional circuit design technique. We show that for the first time the input current pulsing scheme for PCM programming can be significantly simplified via the unique intrinsic thermal memory effect. The model is implemented In HSPICE using Verilog-A, which is flexible and portable for different circuit simulators. As PCM technology is emerging, the predictive compact model can expedite the novel technology development.
AB - A physical yet analytical phase change memory (PCM) model simultaneously accounting for thermal and electrical conductivities is presented. Due to the physics based nature of the model, the essential temperature from heating and cooling of PCM during operation is instantaneously updated. More importantly, the model can be applied to non-conventional circuit design technique. We show that for the first time the input current pulsing scheme for PCM programming can be significantly simplified via the unique intrinsic thermal memory effect. The model is implemented In HSPICE using Verilog-A, which is flexible and portable for different circuit simulators. As PCM technology is emerging, the predictive compact model can expedite the novel technology development.
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U2 - 10.1109/ICICDT.2008.4567278
DO - 10.1109/ICICDT.2008.4567278
M3 - Conference contribution
AN - SCOPUS:51849168976
SN - 9781424418114
T3 - Proceedings - 2008 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT
SP - 199
EP - 202
BT - Proceedings - 2008 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT
T2 - IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2008
Y2 - 2 June 2008 through 4 June 2008
ER -