Temperature dependence of electrical characteristics of strained nMOSFETs using stress memorization technique

Po Chin Huang, San Lein Wu, Shoou Jinn Chang, Cheng Wen Kuo, Ching Yao Chang, Yao Tsung Huang, Yao Chin Cheng, Osbert Cheng

研究成果: Article同行評審

2 引文 斯高帕斯(Scopus)

指紋 深入研究「Temperature dependence of electrical characteristics of strained nMOSFETs using stress memorization technique」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science