Temperature dependent X-ray absorption spectroscopy of the valence transition in EuNi2(Si0.20Ge0.80)2

Kazuya Yamamoto, Koji Horiba, Munetaka Taguchi, Masaharu Matsunami, Nozomu Kamakura, Yasutaka Takata, Ashish Atma Chainani, Kojiro Mimura, Masayuki Shiga, Hirofumi Wada, Yasunori Senba, Haruhiko Ohashi, Shik Shin

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

摘要

We investigate the temperature induced mixed valence transition in EuNi2(Si0.2Ge0.8)2 using Eu 3d-4f X-ray absorption spectroscopy (XAS). The unoccupied 4f states are studied as a function of temperature (27-120 K), across the critical valence temperature, Tv = 80 K. The Eu 3d-4f X-ray absorption spectra show systematic changes of the mixed valency with temperature. The Eu2 + and Eu3 + spectral features match very well with atomic multiplet calculations. The observed non-integral mean valence changes systematically from ∼ 2.70 ± 0.03 (27 K) to ∼ 2.35 ± 0.03 (120 K), consistent with bulk-sensitive measurements.

原文English
頁(從 - 到)681-682
頁數2
期刊Physica B: Condensed Matter
378-380
發行號SPEC. ISS.
DOIs
出版狀態Published - 2006 五月 1

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 凝聚態物理學
  • 電氣與電子工程

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