Test and diagnosis algorithm generation and evaluation for MRAM write disturbance fault

Wan Yu Lo, Ching Yi Chen, Chin Lung Su, Cheng Wen Wu

研究成果: Conference contribution

3 引文 斯高帕斯(Scopus)

摘要

We proposed the systematic tools, RAMSES-M and TAGS-M, for test and diagnosis algorithms evaluation and development, respectively. In addition to traditional memoryfault models, the tools support the MRAM specific fault model, Write Disturbance Fault (WDF) and its specific test operation, Read-previous, which is proposed in this paper, too. The concept of Weighted Fault Coverage (WFC) is introduced and adopted by RAMSES-M. Several test and diagnosis algorithms generated by the proposed tool are compared with other conventional March algorithms. The results show that the proposed algorithms have better performance for testing and diagnosis.

原文English
主出版物標題Proceedings of the 17th Asian Test Symposium, ATS 2008
頁面417-422
頁數6
DOIs
出版狀態Published - 2008 十二月 1
事件17th Asian Test Symposium, ATS 2008 - Sapporo, Japan
持續時間: 2008 十一月 242008 十一月 27

出版系列

名字Proceedings of the Asian Test Symposium
ISSN(列印)1081-7735

Other

Other17th Asian Test Symposium, ATS 2008
國家/地區Japan
城市Sapporo
期間08-11-2408-11-27

All Science Journal Classification (ASJC) codes

  • 電氣與電子工程

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