Test and diagnosis of word-oriented multiport memories

Chih Wea Wang, Kuo Liang Cheng, Chih Tsun Huang, Cheng Wen Wu

研究成果: Conference contribution

7 引文 斯高帕斯(Scopus)

摘要

Conventionally, the test of multiport memories is considered difficult because of the complex behavior of the faulty memories and the large number of inter-port faults. This paper presents an efficient approach for testing and diagnosing multiport RAMs. Our approach takes advantage of the higher access bandwidth due to the increased number of read/write ports, which also provides higher observability and controllability that effectively reduces the test time. Our key idea is that a sequence of March operations for any memory cell can be folded and executed within a single access cycle. We have also developed an efficient test algorithm for port-specific faults as well as traditional cell faults. The port-specific faults include the stuck-open, address decoder, and inter-port faults, for both bit-oriented and word-oriented RAMs. Experimental results for our folding scheme show that the test time reduction is about 28% for a commercial 8 KB embedded SRAM. An efficient diagnostic algorithm is also proposed for the port-specific faults and traditional cell faults.

原文English
主出版物標題Proceedings - 21st IEEE VLSI Test Symposium, VTS 2003
發行者IEEE Computer Society
頁面248-253
頁數6
ISBN(電子)0769519245
DOIs
出版狀態Published - 2003 一月 1
事件21st IEEE VLSI Test Symposium, VTS 2003 - Napa Valley, United States
持續時間: 2003 四月 272003 五月 1

出版系列

名字Proceedings of the IEEE VLSI Test Symposium
2003-January

Conference

Conference21st IEEE VLSI Test Symposium, VTS 2003
國家/地區United States
城市Napa Valley
期間03-04-2703-05-01

All Science Journal Classification (ASJC) codes

  • 電腦科學應用
  • 電氣與電子工程

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