@inproceedings{25b76727d96a4f0bb2b87e5195e033ce,
title = "Test integration for SOC supporting very low-cost testers",
abstract = "To reduce test cost for SOC products, it is important to reduce the cost of testers. When using low-cost testers which have a limited test bandwidth to perform testing, Built-In-Self-Test (BIST) is necessary to reduce the data volume to be transmitted between the tester and the device-under-test (DUT). We enhance the SOC test integration tool, STEAC, so that it can support SOCs containing BISTed cores which are to be tested by low-cost testers. A test chip is implemented to verify the proposed technique. Experimental results show that the enhanced STEAC successfully works with the HOY wireless test system and other low-cost testers.",
author = "Chi, {Chun Chuan} and Lo, {Chih Yen} and Ko, {Te Wen} and Wu, {Cheng Wen}",
year = "2009",
month = dec,
day = "1",
doi = "10.1109/ATS.2009.51",
language = "English",
isbn = "9780769538648",
series = "Proceedings of the Asian Test Symposium",
pages = "287--292",
booktitle = "Proceedings of the 18th Asian Test Symposium, ATS 2009",
note = "18th Asian Test Symposium, ATS 2009 ; Conference date: 23-11-2009 Through 26-11-2009",
}