Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns

Chih Yuang Su, Cheng Wen Wu

研究成果: Article同行評審

25 引文 斯高帕斯(Scopus)

摘要

We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.

原文English
頁(從 - 到)495-501
頁數7
期刊IEEE Transactions on Computers
43
發行號4
DOIs
出版狀態Published - 1994 一月 1

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

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