The Association between Readmission Rates and Length of Stay for Schizophrenia: A Three-year Population-based Study

Wei-Hua Tian, Herng Ching Lin, Chin Shyan Chen, Tsai Ching Liu, Shang Ying Tsai, Hsin Chien Lee

研究成果: Article › 同行評審

All Science Journal Classification (ASJC) codes

@article{1643d26b5db64492a64d85df945f9d54,

title = "The Association between Readmission Rates and Length of Stay for Schizophrenia: A Three-year Population-based Study",

author = "Wei-Hua Tian and Lin, {Herng Ching} and Chen, {Chin Shyan} and Liu, {Tsai Ching} and Tsai, {Shang Ying} and Lee, {Hsin Chien}",

year = "2006",

language = "English",

volume = "83",

pages = "211--214",

journal = "Schizophrenia Research",

issn = "0920-9964",

publisher = "Elsevier",

number = "2-3",

}

TY - JOUR

T1 - The Association between Readmission Rates and Length of Stay for Schizophrenia: A Three-year Population-based Study

AU - Tian, Wei-Hua

AU - Lin, Herng Ching

AU - Chen, Chin Shyan

AU - Liu, Tsai Ching

AU - Tsai, Shang Ying

AU - Lee, Hsin Chien

PY - 2006

Y1 - 2006

M3 - Article

SN - 0920-9964

VL - 83

SP - 211

EP - 214

JO - Schizophrenia Research

JF - Schizophrenia Research

IS - 2-3

ER -