The atomistic study of textured polycrystalline nanofilms

I. L. Chang, W. C. Ding

研究成果: Article

1 引文 (Scopus)

摘要

Molecular dynamics method incorporating with parallel computing technique was employed to study the mechanical properties of textured polycrystalline nanofilms with fixed out-of-plane normal direction. The grain size and film thickness effects on both the elastic and plastic properties of the copper nanofilm were examined. It is shown from the simulation that the elastic and plastic properties (i.e., Young's modulus, Poisson's ratio, biaxial yield stress, etc) of textured polycrystalline nanofilms depend on the grain size and the film thickness. As the grain size of the nanofilm become larger, the Young's modulus and biaxial yield stress increase but the Poisson's ratio decreases. It is observed that both the grain boundary sliding and the dislocation emerging inside the grains are the dominant mechanisms for the plastic deformation and thus, the inverse Hall-Petch effect becomes prominent in polycrystalline nanofilm. Moreover, as the thickness of the nanofilm increases, the Young's modulus increase but the biaxial yield stress does not show clear dependence.

原文English
頁(從 - 到)297-312
頁數16
期刊CMES - Computer Modeling in Engineering and Sciences
68
發行號3
出版狀態Published - 2010 十二月 1

指紋

Yield Stress
Biaxial
Young's Modulus
Grain Size
Yield stress
Poisson's Ratio
Elastic moduli
Poisson ratio
Film thickness
Plastics
Hall Effect
Grain boundary sliding
Grain Boundary
Hall effect
Plastic Deformation
Parallel processing systems
Parallel Computing
Dislocation
Molecular Dynamics
Copper

All Science Journal Classification (ASJC) codes

  • Software
  • Modelling and Simulation
  • Computer Science Applications

引用此文

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The atomistic study of textured polycrystalline nanofilms. / Chang, I. L.; Ding, W. C.

於: CMES - Computer Modeling in Engineering and Sciences, 卷 68, 編號 3, 01.12.2010, p. 297-312.

研究成果: Article

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