摘要
We adopt the quasi-steady-state thermoelastic analysis with the effect of interface shape to predict the dislocation density pattern in Czochralski-pulled single crystal. The results show that the dislocation density deduced from the analysis with effect of curved interface is quite different from that with effect of the planar interface. Quantitatively, this difference of the dislocation density on sections near the interface between the two cases (planar and curved interfaces) may exceed more than 20%, under normal operation condition.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 385-394 |
| 頁數 | 10 |
| 期刊 | International Communications in Heat and Mass Transfer |
| 卷 | 19 |
| 發行號 | 3 |
| DOIs | |
| 出版狀態 | Published - 1992 1月 1 |
All Science Journal Classification (ASJC) codes
- 原子與分子物理與光學
- 一般化學工程
- 凝聚態物理學
指紋
深入研究「The effect of interface shape on dislocation generation during crystal growth」主題。共同形成了獨特的指紋。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver