The exchange bias of a permalloy and ordered structure of epitaxial PtMn prepared from the growth of thin (Pt/Mn) multilayers

Chih Hao Lee; J. H. Lai; Yi Fan Wu; J. C.A. Huang

doi:10.1016/j.jmmm.2006.01.043

The exchange bias of a permalloy and ordered structure of epitaxial PtMn prepared from the growth of thin (Pt/Mn) multilayers

Chih Hao Lee
, J. H. Lai
, Yi Fan Wu
, J. C.A. Huang

物理學系

研究成果: Article › 同行評審

2 引文斯高帕斯（Scopus）

摘要

The influence of PtMn composition and post-annealing on the structure and the exchange bias of epitaxial PtMn(150 Å)/Ni₈₀Fe₂₀(50 Å) films using multilayer growth of [Mn(2 Å<XÅ<3.2 Å)/Pt (2 Å)]_N was studied. The optimal H_ex increases to ∼360 Oe after annealing at 250 °C for 18 h. The X-ray diffraction study indicates that the integrated intensity of the FCT PtMn(1 1 0) diffraction peak scales quite well with the exchange biasing field and order parameter.

原文	English
頁（從 - 到）	e156-e159
期刊	Journal of Magnetism and Magnetic Materials
卷	303
發行號	2 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.jmmm.2006.01.043
出版狀態	Published - 2006 8月

All Science Journal Classification (ASJC) codes

電子、光磁材料
凝聚態物理學

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10.1016/j.jmmm.2006.01.043

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title = "The exchange bias of a permalloy and ordered structure of epitaxial PtMn prepared from the growth of thin (Pt/Mn) multilayers",

abstract = "The influence of PtMn composition and post-annealing on the structure and the exchange bias of epitaxial PtMn(150 {\AA})/Ni80Fe20(50 {\AA}) films using multilayer growth of [Mn(2 {\AA}N was studied. The optimal Hex increases to ∼360 Oe after annealing at 250 °C for 18 h. The X-ray diffraction study indicates that the integrated intensity of the FCT PtMn(1 1 0) diffraction peak scales quite well with the exchange biasing field and order parameter.",

author = "Lee, \{Chih Hao\} and Lai, \{J. H.\} and Wu, \{Yi Fan\} and Huang, \{J. C.A.\}",

note = "Funding Information: The authors are grateful for the beamtime offered by NSRRC and the financial support of the National Science Council under contract no. of NSC91-2112-M-006-029. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.",

year = "2006",

month = aug,

doi = "10.1016/j.jmmm.2006.01.043",

language = "English",

volume = "303",

pages = "e156--e159",

journal = "Journal of Magnetism and Magnetic Materials",

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T1 - The exchange bias of a permalloy and ordered structure of epitaxial PtMn prepared from the growth of thin (Pt/Mn) multilayers

AU - Lee, Chih Hao

AU - Lai, J. H.

AU - Wu, Yi Fan

AU - Huang, J. C.A.

N1 - Funding Information: The authors are grateful for the beamtime offered by NSRRC and the financial support of the National Science Council under contract no. of NSC91-2112-M-006-029. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.

PY - 2006/8

Y1 - 2006/8

N2 - The influence of PtMn composition and post-annealing on the structure and the exchange bias of epitaxial PtMn(150 Å)/Ni80Fe20(50 Å) films using multilayer growth of [Mn(2 ÅN was studied. The optimal Hex increases to ∼360 Oe after annealing at 250 °C for 18 h. The X-ray diffraction study indicates that the integrated intensity of the FCT PtMn(1 1 0) diffraction peak scales quite well with the exchange biasing field and order parameter.

AB - The influence of PtMn composition and post-annealing on the structure and the exchange bias of epitaxial PtMn(150 Å)/Ni80Fe20(50 Å) films using multilayer growth of [Mn(2 ÅN was studied. The optimal Hex increases to ∼360 Oe after annealing at 250 °C for 18 h. The X-ray diffraction study indicates that the integrated intensity of the FCT PtMn(1 1 0) diffraction peak scales quite well with the exchange biasing field and order parameter.

UR - https://www.scopus.com/pages/publications/33646260233

UR - https://www.scopus.com/pages/publications/33646260233#tab=citedBy

U2 - 10.1016/j.jmmm.2006.01.043

DO - 10.1016/j.jmmm.2006.01.043

M3 - Article

AN - SCOPUS:33646260233

SN - 0304-8853

VL - 303

SP - e156-e159

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - 2 SPEC. ISS.

ER -

The exchange bias of a permalloy and ordered structure of epitaxial PtMn prepared from the growth of thin (Pt/Mn) multilayers

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