跳至主導覽 跳至搜尋 跳過主要內容

The polarized neutron reflectivity and X-ray reflectivity studies of the magnetic profiles of epitaxial Ni80Fe20/Ru multilayers

  • Hui Chia Su
  • , Jinn Jer Peir
  • , Chih Hao Lee
  • , Ming Zhe Lin
  • , Po Tsang Wu
  • , J. C.A. Huang
  • , Zin Tun

研究成果: Article同行評審

7   連結會在新分頁中開啟 引文 斯高帕斯(Scopus)

摘要

The depth profiles of the epitaxial Ni80Fe20(1 1 1)/Ru(0 0 0 1) multilayers were studied by polarized neutron reflectivity and X-ray reflectivity. At the Ru thickness that the anti-ferromagnetic coupling was found, the magnetic moments between two Ni80Fe20 interlayers show a biquadratic coupling effect with a double unit cell at low applied fields. A magnetic dead layer of about 0.3 nm was also found at the interface boundaries. The maximal polarization effect applied to the Ru layer is less than 0.03μB.

原文English
頁(從 - 到)80-83
頁數4
期刊Physica B: Condensed Matter
357
發行號1-2 SPEC. ISS.
DOIs
出版狀態Published - 2005 2月 28

All Science Journal Classification (ASJC) codes

  • 電子、光磁材料
  • 凝聚態物理學
  • 電氣與電子工程

指紋

深入研究「The polarized neutron reflectivity and X-ray reflectivity studies of the magnetic profiles of epitaxial Ni80Fe20/Ru multilayers」主題。共同形成了獨特的指紋。

引用此