The use of spatially-dependent carrier capture rates for deep-level-defect transient studies

Engineering

• Deep Level 100%
• Electric Field 66%
• State Concentration 66%
• Illustrates 33%
• Good Agreement 33%
• Data Show 33%
• Field Strength 33%
• Fermi Level 33%
• Measured Data 33%
• Intersect 33%
• Depletion Layer 33%
• Pulse Amplitude 33%
• Measure Signal 33%
• Strong Variation 33%

Keyphrases

• Pulse Height 33%