The electrical resistivity of thin films of a topological insulator of Bi2Se3 with a thickness of 10 nm to 75 nm, single crystal of Bi2Se3 with thickness of 0.65 mm in the temperature range from 4.2 to 300 K was measured. A size effect in the electrical conductivity of Bi2Se3 films was observed, i.e. linear dependence of the conductivity of the sample on its inverse thickness. It was suggested that similar effects should be observed in other TIs and systems with non-uniform distribution of direct current over the cross section of the sample.
|期刊||Journal of Physics: Conference Series|
|出版狀態||Published - 2019 十一月 28|
|事件||7th Euro-Asian Symposium on Trends in Magnetism, EASTMAG 2019 - Ekaterinburg, Russian Federation|
持續時間: 2019 九月 8 → 2019 九月 13
All Science Journal Classification (ASJC) codes
- 物理與天文學 (全部)