Thickness dependent transport properties and percolative phase separation in polycrystalline manganite thin films

Y. H. Chen, T. B. Wu

研究成果: Article同行評審

8 引文 斯高帕斯(Scopus)

摘要

The effects of film thicknesses on the electronic transport and percolative metal-insulator (M-I) transition of La1-xSrxMnO 3 (LSMO) films have been investigated. The conductivity increases with the layer thickness; this is regarded as the relaxation of tensile strains and reduction in grain boundaries (fewer scattering centers) as well as shorter hopping distances, which suppresses the Jahn-Teller distortion or enhances the double exchange. It is also observed by conductive atomic force microscopy (CAFM) that metallic and insulating regions coexist in LSMO films. The domains undergo a percolative M-I transition, and TM-I observed by CAFM is consistent with the result of four-point probe measurements.

原文English
文章編號224104
期刊Applied Physics Letters
93
發行號22
DOIs
出版狀態Published - 2008

All Science Journal Classification (ASJC) codes

  • 物理與天文學(雜項)

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