The effects of film thicknesses on the electronic transport and percolative metal-insulator (M-I) transition of La1-xSrxMnO 3 (LSMO) films have been investigated. The conductivity increases with the layer thickness; this is regarded as the relaxation of tensile strains and reduction in grain boundaries (fewer scattering centers) as well as shorter hopping distances, which suppresses the Jahn-Teller distortion or enhances the double exchange. It is also observed by conductive atomic force microscopy (CAFM) that metallic and insulating regions coexist in LSMO films. The domains undergo a percolative M-I transition, and TM-I observed by CAFM is consistent with the result of four-point probe measurements.
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