Thickness effect on stress-induced exchange anisotropy of NiFe/NiFeMn

Chih Huang Lai, Shing An Chen, J. C.A. Huang

研究成果: Conference article同行評審

3 引文 斯高帕斯(Scopus)

摘要

Samples with the structure Mo (20 nm)/NiFe (t nm)/NiFeMn (12 nm)/Mo (2 nm) were grown on the Al2O3 (11-20) substrates by a MBE system. Although no magnetic field was applied during depositions, shifted hysteresis loops were observed in as-deposited samples, which were attributable to the stress-induced exchange anisotropy. With increasing thickness of NiFe, the residual stress on NiFe decreased, which resulted in the decrease of NiFe anisotropy. The exchange field decreased with increasing NiFe thickness but with a transition point at t = 12nm, at which the residual stress on top of NiFe might be significantly released.

原文English
頁(從 - 到)6656-6658
頁數3
期刊Journal of Applied Physics
87
發行號9 III
DOIs
出版狀態Published - 2000 五月 1
事件44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States
持續時間: 1999 十一月 151999 十一月 18

All Science Journal Classification (ASJC) codes

  • 物理與天文學 (全部)

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