Thin oxide breakdown mechanism of constant voltage stress on MOSFETs

J. H. Chen, C. T. Wei, S. C. Wong, Y. H. Wang

研究成果: Conference article

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Thin oxide breakdown mechanism of constant voltage stress on MOSFETs」主題。共同形成了獨特的指紋。

Mathematics

Physics & Astronomy