摘要
In this article, an analysis of nonlinear three-dimensional (3-D) morphological instabilities in chemical vapor deposition (CVD) is presented. We establish a set of mathematically governing equation and boundary condition for the system of CVD and derive a weakly nonlinear evolution equation by considering a diffusion-limited growth condition to study the morphological instabilities in the CVD process. This evolution equation not only can predict the behaviors of interfacial growth of films, but can also be a basis of weakly nonlinear analysis. The analysis from critical condition is adopted to investigate the two-dimensional (2-D) band-like cells and the 3-D hexagonal structures.
原文 | English |
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頁(從 - 到) | 371-380 |
頁數 | 10 |
期刊 | Thin Solid Films |
卷 | 304 |
發行號 | 1-2 |
DOIs | |
出版狀態 | Published - 1997 7月 |
All Science Journal Classification (ASJC) codes
- 電子、光磁材料
- 表面和介面
- 表面、塗料和薄膜
- 金屬和合金
- 材料化學