Topological Hall Effect in Single Thick SrRuO3 Layers Induced by Defect Engineering

Changan Wang, Ching Hao Chang, Andreas Herklotz, Chao Chen, Fabian Ganss, Ulrich Kentsch, Deyang Chen, Xingsen Gao, Yu Jia Zeng, Olav Hellwig, Manfred Helm, Sibylle Gemming, Ying Hao Chu, Shengqiang Zhou

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7 引文 斯高帕斯(Scopus)

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Engineering & Materials Science

Chemical Compounds