Two control and observation structures for analogue circuits

Kuen Jong Lee, Yun Che Wen

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

摘要

Two novel analogue control and observation structures which can be used to increase the testability of analogue circuits are presented. Both structures can be easily incorporated into the IEEE P 1149.4 environment to execute both DC and AC testing. The first structure consists of five switches and can perform concurrent testing. The second contains only four switches but is mainly used for off-line testing.

原文English
頁(從 - 到)1590-1592
頁數3
期刊Electronics Letters
33
發行號19
DOIs
出版狀態Published - 1997 九月 11

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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