TY - JOUR
T1 - Variability effects in graphene
T2 - Challenges and opportunities for device engineering and applications
AU - Xu, Guangyu
AU - Zhang, Yuegang
AU - Duan, Xiangfeng
AU - Balandin, Alexander A.
AU - Wang, Kang L.
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2013
Y1 - 2013
N2 - Variability effects in graphene can result from the surrounding environment and the graphene material itself, which form a critical issue in examining the feasibility of graphene devices for large-scale production. From the reliability and yield perspective, these variabilities cause fluctuations in the device performance, which should be minimized via device engineering. From the metrology perspective, however, the variability effects can function as novel probing mechanisms, in which the 'signal fluctuations' can be useful for potential sensing applications. This paper presents an overview of the variability effects in graphene, with emphasis on their challenges and opportunities for device engineering and applications. The discussion can extend to other thin-film, nanowire, and nanotube devices with similar variability issues, forming general interest in evaluating the promise of emerging technologies.
AB - Variability effects in graphene can result from the surrounding environment and the graphene material itself, which form a critical issue in examining the feasibility of graphene devices for large-scale production. From the reliability and yield perspective, these variabilities cause fluctuations in the device performance, which should be minimized via device engineering. From the metrology perspective, however, the variability effects can function as novel probing mechanisms, in which the 'signal fluctuations' can be useful for potential sensing applications. This paper presents an overview of the variability effects in graphene, with emphasis on their challenges and opportunities for device engineering and applications. The discussion can extend to other thin-film, nanowire, and nanotube devices with similar variability issues, forming general interest in evaluating the promise of emerging technologies.
UR - http://www.scopus.com/inward/record.url?scp=84879889686&partnerID=8YFLogxK
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U2 - 10.1109/JPROC.2013.2247971
DO - 10.1109/JPROC.2013.2247971
M3 - Article
AN - SCOPUS:84879889686
VL - 101
SP - 1670
EP - 1688
JO - Proceedings of the IEEE
JF - Proceedings of the IEEE
SN - 0018-9219
IS - 7
M1 - 6487371
ER -