Virtual-metrology-based FDC scheme

研究成果: Conference contribution

1 引文 斯高帕斯(Scopus)

摘要

Most conventional fault-detection-and-classification (FDC) approaches are to find out the target devices (TDs) required for monitoring and the TDs' related key parameters needed to be monitored, and then by applying the statistical-process-control (SPC) approach to detect the faults. However, in practical situation, an abnormal key-parameter value may not be solely caused by its own TD; instead, it may also be resulted from the other related parameters. As a result, accurate fault classification or diagnosis may not be achieved. The purpose of this paper is to propose a virtual-metrology-based baseline FDC scheme that includes the TD baseline model and FDC logic. By applying this baseline FDC scheme, fault diagnosis can then be accomplished.

原文English
主出版物標題2012 IEEE International Conference on Automation Science and Engineering
主出版物子標題Green Automation Toward a Sustainable Society, CASE 2012
頁面80-85
頁數6
DOIs
出版狀態Published - 2012 十二月 1
事件2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012 - Seoul, Korea, Republic of
持續時間: 2012 八月 202012 八月 24

出版系列

名字IEEE International Conference on Automation Science and Engineering
ISSN(列印)2161-8070
ISSN(電子)2161-8089

Other

Other2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012
國家Korea, Republic of
城市Seoul
期間12-08-2012-08-24

    指紋

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

引用此

Hsieh, Y. S., Cheng, F. T., & Yang, H. C. (2012). Virtual-metrology-based FDC scheme. 於 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012 (頁 80-85). [6386371] (IEEE International Conference on Automation Science and Engineering). https://doi.org/10.1109/CoASE.2012.6386371