Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer

De Wei Huang, Hsueh Pin Lin, Dung Ching Perng

研究成果: Conference contribution

摘要

This study reports a hybrid visible-blind ultraviolet (UV) photodetectors (PDs) with a poly-(N-vinylcarbazole) (PVK) intermediate layer between the NiO thin film and ZnO nanorods (NRs). The insertion of a PVK buffer layer between the NiO thin film and ZnO NRs is able to effectively reduce leakage path and lower the recombination of photo-excited carriers at the interface. The best photo-responsivity of the n-ZnO/PVK/p-NiO PD was found to be as high as 57.31 AAV at a-3 V bias under UV illumination at 380 run, which corresponded to an external quantum efficiency of 1.87×104 %. The light-to-dark current ratios of the PD with and without the PVK intermediate layer at a reverse bias of 3 V are 3.32×102 and 12, respectively. The ZnO/PVK/NiO PD also exhibited UV-selective photo-response with an UV-to-visible rejection ratio (R380nm/R450nm) of more than 102. The proposed PD with a PVK intermediate layer has the potential for developing low-cost and high-performance UV PDs in sensing applications.

原文English
主出版物標題TechConnect Briefs 2018 - Informatics, Electronics and Microsystems
編輯Matthew Laudon, Fiona Case, Bart Romanowicz, Fiona Case
發行者TechConnect
頁面213-216
頁數4
ISBN(電子)9780998878256
出版狀態Published - 2018 一月 1
事件11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference - Anaheim, United States
持續時間: 2018 五月 132018 五月 16

出版系列

名字TechConnect Briefs 2018 - Advanced Materials
4

Other

Other11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference
國家United States
城市Anaheim
期間18-05-1318-05-16

指紋

Photodetectors
Nanorods
Thin films
Dark currents
Buffer layers
Quantum efficiency
poly-N-vinylcarbazole
Lighting
Costs

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

引用此文

Huang, D. W., Lin, H. P., & Perng, D. C. (2018). Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. 於 M. Laudon, F. Case, B. Romanowicz, & F. Case (編輯), TechConnect Briefs 2018 - Informatics, Electronics and Microsystems (頁 213-216). (TechConnect Briefs 2018 - Advanced Materials; 卷 4). TechConnect.
Huang, De Wei ; Lin, Hsueh Pin ; Perng, Dung Ching. / Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. 編輯 / Matthew Laudon ; Fiona Case ; Bart Romanowicz ; Fiona Case. TechConnect, 2018. 頁 213-216 (TechConnect Briefs 2018 - Advanced Materials).
@inproceedings{07bb7b298a39433fba06da4d0a5facb6,
title = "Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer",
abstract = "This study reports a hybrid visible-blind ultraviolet (UV) photodetectors (PDs) with a poly-(N-vinylcarbazole) (PVK) intermediate layer between the NiO thin film and ZnO nanorods (NRs). The insertion of a PVK buffer layer between the NiO thin film and ZnO NRs is able to effectively reduce leakage path and lower the recombination of photo-excited carriers at the interface. The best photo-responsivity of the n-ZnO/PVK/p-NiO PD was found to be as high as 57.31 AAV at a-3 V bias under UV illumination at 380 run, which corresponded to an external quantum efficiency of 1.87×104 {\%}. The light-to-dark current ratios of the PD with and without the PVK intermediate layer at a reverse bias of 3 V are 3.32×102 and 12, respectively. The ZnO/PVK/NiO PD also exhibited UV-selective photo-response with an UV-to-visible rejection ratio (R380nm/R450nm) of more than 102. The proposed PD with a PVK intermediate layer has the potential for developing low-cost and high-performance UV PDs in sensing applications.",
author = "Huang, {De Wei} and Lin, {Hsueh Pin} and Perng, {Dung Ching}",
year = "2018",
month = "1",
day = "1",
language = "English",
series = "TechConnect Briefs 2018 - Advanced Materials",
publisher = "TechConnect",
pages = "213--216",
editor = "Matthew Laudon and Fiona Case and Bart Romanowicz and Fiona Case",
booktitle = "TechConnect Briefs 2018 - Informatics, Electronics and Microsystems",

}

Huang, DW, Lin, HP & Perng, DC 2018, Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. 於 M Laudon, F Case, B Romanowicz & F Case (編輯), TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. TechConnect Briefs 2018 - Advanced Materials, 卷 4, TechConnect, 頁 213-216, 11th Annual TechConnect World Innovation Conference and Expo, Held Jointly with the 20th Annual Nanotech Conference and Expo,the 2018 SBIR/STTR Spring Innovation Conference, and the Defense TechConnect DTC Spring Conference, Anaheim, United States, 18-05-13.

Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. / Huang, De Wei; Lin, Hsueh Pin; Perng, Dung Ching.

TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. 編輯 / Matthew Laudon; Fiona Case; Bart Romanowicz; Fiona Case. TechConnect, 2018. p. 213-216 (TechConnect Briefs 2018 - Advanced Materials; 卷 4).

研究成果: Conference contribution

TY - GEN

T1 - Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer

AU - Huang, De Wei

AU - Lin, Hsueh Pin

AU - Perng, Dung Ching

PY - 2018/1/1

Y1 - 2018/1/1

N2 - This study reports a hybrid visible-blind ultraviolet (UV) photodetectors (PDs) with a poly-(N-vinylcarbazole) (PVK) intermediate layer between the NiO thin film and ZnO nanorods (NRs). The insertion of a PVK buffer layer between the NiO thin film and ZnO NRs is able to effectively reduce leakage path and lower the recombination of photo-excited carriers at the interface. The best photo-responsivity of the n-ZnO/PVK/p-NiO PD was found to be as high as 57.31 AAV at a-3 V bias under UV illumination at 380 run, which corresponded to an external quantum efficiency of 1.87×104 %. The light-to-dark current ratios of the PD with and without the PVK intermediate layer at a reverse bias of 3 V are 3.32×102 and 12, respectively. The ZnO/PVK/NiO PD also exhibited UV-selective photo-response with an UV-to-visible rejection ratio (R380nm/R450nm) of more than 102. The proposed PD with a PVK intermediate layer has the potential for developing low-cost and high-performance UV PDs in sensing applications.

AB - This study reports a hybrid visible-blind ultraviolet (UV) photodetectors (PDs) with a poly-(N-vinylcarbazole) (PVK) intermediate layer between the NiO thin film and ZnO nanorods (NRs). The insertion of a PVK buffer layer between the NiO thin film and ZnO NRs is able to effectively reduce leakage path and lower the recombination of photo-excited carriers at the interface. The best photo-responsivity of the n-ZnO/PVK/p-NiO PD was found to be as high as 57.31 AAV at a-3 V bias under UV illumination at 380 run, which corresponded to an external quantum efficiency of 1.87×104 %. The light-to-dark current ratios of the PD with and without the PVK intermediate layer at a reverse bias of 3 V are 3.32×102 and 12, respectively. The ZnO/PVK/NiO PD also exhibited UV-selective photo-response with an UV-to-visible rejection ratio (R380nm/R450nm) of more than 102. The proposed PD with a PVK intermediate layer has the potential for developing low-cost and high-performance UV PDs in sensing applications.

UR - http://www.scopus.com/inward/record.url?scp=85050905100&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85050905100&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85050905100

T3 - TechConnect Briefs 2018 - Advanced Materials

SP - 213

EP - 216

BT - TechConnect Briefs 2018 - Informatics, Electronics and Microsystems

A2 - Laudon, Matthew

A2 - Case, Fiona

A2 - Romanowicz, Bart

A2 - Case, Fiona

PB - TechConnect

ER -

Huang DW, Lin HP, Perng DC. Visible-blind ultraviolet photodetectors based on NiO/ZnO NRs with poly-(N-vinylcarbazole) intermediate layer. 於 Laudon M, Case F, Romanowicz B, Case F, 編輯, TechConnect Briefs 2018 - Informatics, Electronics and Microsystems. TechConnect. 2018. p. 213-216. (TechConnect Briefs 2018 - Advanced Materials).