Wavelet transform for corner detection

J. S. Lee, Y. N. Sun, C. H. Chen

研究成果: Conference contribution

2 引文 斯高帕斯(Scopus)

摘要

In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

原文English
主出版物標題Proceedings of the IEEE International Conference on Systems Engineering
發行者Institute of Electrical and Electronics Engineers Inc.
頁面596-599
頁數4
ISBN(電子)0780307348, 9780780307346
DOIs
出版狀態Published - 1992 1月 1
事件1992 IEEE International Conference on Systems Engineering - Kobe, Japan
持續時間: 1992 9月 171992 9月 19

出版系列

名字Proceedings of the IEEE International Conference on Systems Engineering

Conference

Conference1992 IEEE International Conference on Systems Engineering
國家/地區Japan
城市Kobe
期間92-09-1792-09-19

All Science Journal Classification (ASJC) codes

  • 流體流動和轉移過程
  • 訊號處理
  • 計算力學
  • 工業與製造工程
  • 控制與系統工程
  • 機械工業
  • 計算數學
  • 控制和優化

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