Wavelet transform for corner detection

J. S. Lee, Y. N. Sun, C. H. Chen

研究成果: Conference contribution

2 引文 斯高帕斯(Scopus)

摘要

In this s paper, a. novel wavelet based corner Detecting algorithm is proposed. Some intrinsic indicators implied in corners are extracted by utilizing the wavelet, transform. Since these indicators are independent, of the corner angle and corner curvature, they can be used to detect, corners. In addition, several properties of corners in the multiscale wavelet transform are introduced. By applying these indicators and properties, corners can be detected correctly and efficiently. The experimental results show that our algorithm achieves better accuracy than the conventional single-scale corner detected. On the other hand, our algorithm is more computationally efficient. and casier in implementation, than other multiscale corner detectors. Wavelet, transform, Multiscale, ISDDR, ISDR, SDDR, Intrinsic decay rate, Masking algorithm.

原文English
主出版物標題Proceedings of the IEEE International Conference on Systems Engineering
發行者Institute of Electrical and Electronics Engineers Inc.
頁面596-599
頁數4
ISBN(電子)0780307348, 9780780307346
DOIs
出版狀態Published - 1992 一月 1
事件1992 IEEE International Conference on Systems Engineering - Kobe, Japan
持續時間: 1992 九月 171992 九月 19

出版系列

名字Proceedings of the IEEE International Conference on Systems Engineering

Conference

Conference1992 IEEE International Conference on Systems Engineering
國家Japan
城市Kobe
期間92-09-1792-09-19

    指紋

All Science Journal Classification (ASJC) codes

  • Fluid Flow and Transfer Processes
  • Signal Processing
  • Computational Mechanics
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Mechanical Engineering
  • Computational Mathematics
  • Control and Optimization

引用此

Lee, J. S., Sun, Y. N., & Chen, C. H. (1992). Wavelet transform for corner detection. 於 Proceedings of the IEEE International Conference on Systems Engineering (頁 596-599). [236905] (Proceedings of the IEEE International Conference on Systems Engineering). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSYSE.1992.236905