@inproceedings{adea67d9e5484be987dfc802bfeafa86,
title = "WRAP: Weight RemApping and Processing in RRAM-based Neural Network Accelerators Considering Thermal Effect",
abstract = "Resistive random-access memory (RRAM) has shown great potential for computing in memory (CIM) to support the requirements of high memory bandwidth and low power in neuromorphic computing systems. However, the accuracy of RRAM-based neural network (NN) accelerators can degrade significantly due to the intrinsic statistical variations of the resistance of RRAM cells, as well as the negative effects of high temperatures. In this paper, we propose a subarray-based thermal-aware weight remapping and processing framework (WRAP) to map the weights of a neural network model into RRAM subarrays. Instead of dealing with each weight individually, this framework maps weights into subarrays and performs subarray-based algorithms to reduce computational complexity while maintaining accuracy under thermal impact. Experimental results demonstrate that using our framework, inference accuracy losses of four DNN models are less than 2% compared to the ideal results and 1% with compensation applied even when the surrounding temperature is around 360K.",
author = "Chen, {Po Yuan} and Gu, {Fang Yi} and Huang, {Yu Hong} and Lin, {Ing Chao}",
note = "Funding Information: ACKNOWLEDGEMENT This work is supported in part by the Ministry of Science and Technology under grant MOST 109-2628-E-006-012-MY3 and 110-2221-E-006-084-MY3 and in part supported by the Intelligent Manufacturing Research Center (iMRC) from the Featured Areas Research Center Program by the Ministry of Education, Taiwan (ROC). Publisher Copyright: {\textcopyright} 2022 EDAA.; 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 ; Conference date: 14-03-2022 Through 23-03-2022",
year = "2022",
doi = "10.23919/DATE54114.2022.9774678",
language = "English",
series = "Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1245--1250",
editor = "Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu",
booktitle = "Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022",
address = "United States",
}